One technique used to characterize the physical and electronic properties of the surface of a material is Helium Scattering and mass spectrometry. A beam of atoms, usually Helium, is aimed at a surface, and atoms from the surface are ejected. Mass Filters are used to measure the atoms that are scattered, and to pinpoint the angle and time at which the scattering atoms are being released (time of flight analysis). Since the events of this non-destructive surface science method happen quickly, this application requires the use of mass filters that provide high stability and fast response times. Extrel’s Quadrupole Mass Filters and RF/DC Power Supplies are the ideal choice for Scattering applications.

Extrel’s Product Line for Scattering Applications includes:

• MAX Flange Mounted Mass Spectrometers - (GP-110)
• Quadrupole Mass Filters - (GP-201)
• RF/DC Power Supplies and RF-only Power Supplies - (GP-203)

Specifications include:

• High Sensitivity to 10 mA/Torr
• High Abundance Sensitivity to 10⁷
• High Short and Long Term Stability

For additional specifications and benefits of the Extrel MAX and MAX-LT Systems and available Components, please view our product guide or contact your local Sales Representative.