Materials Research
Scientists involved in the study of Materials Research are analyzing the surfaces, structures and properties of various materials for many industries. This requires the use of a Mass Spectrometer with not only high sensitivity and resolution, but also precise ionization control and energy analysis capabilities.
Extrel provides the MAX and the MAX-LT™ Systems specifically designed for Materials Research applications. These systems enable the users to find contaminants and atomic scale defects, and provide information about the physical and electronic properties of a surface.
Benefits of Extrel’s Systems:
- High sensitivity with partial pressure detection limits, as low as 5 x 1016 mbar
- High resolution with the ability to separate masses as low as 0.1 or 0.0028 amu apart
- High abundance sensitivity which increases the ability of the instrument to see a small mass that may appear next to a large mass
- An energy analyzer which is available as an extension to our MS Systems
- Fine ionization control which gives the user the ability to perform Appearance Potential Work
- Instruments and components which fit any system configuration, for all applications
The MAX and MAX-LT Systems and various Components are ideal choices for the following applications:
- Catalysis
- Laser Ablation
- Outgassing Studies
- Scattering
- Secondary Ion Mass Spectrometry (SIMS)
- Temperature Programmed Desorption (TPD)
Scientists rely on Extrel’s Systems and Components for surface analysis of various materials that are used every day in an array of industries including semiconductor, aerospace, biomedical, nuclear, ceramics, automotive and medical/surgical. Where high purity is critical, such as in the ceramics, automotive and medical/surgical materials markets, Extrel’s systems are ideal to perform the Outgassing Studies necessary.
For additional specifications and benefits of the Extrel MAX and MAX-LT Systems and available Components, please view our product guide or contact your local Sales Representative.