Scientists involved in the study of Materials Research are analyzing the surfaces, structures and properties of various materials for many industries. This requires the use of a Mass Spectrometer with not only high sensitivity and resolution, but also precise ionization control and energy analysis capabilities.
Scientists rely on Extrels Systems and Components for surface analysis of various materials that are used every day in an array of industries including semiconductor, aerospace, biomedical, nuclear, ceramics, automotive and medical/surgical. Where high purity is critical, such as in the ceramics, automotive and medical/surgical materials markets, Extrels systems are ideal to perform the Outgassing Studies necessary.
Researchers studying the use of Catalysts strive to better understand how they function and respond under different conditions. Tracking the inlet and outlet of the reactor helps the investigator develop an understanding of the catalytic reaction.
Extrel provides a wide range of gas analyzer solutions for catalysis research and development.
To perform surface analysis, surface cleaning, and the removal and redistribution of specific materials, deposition and Carbon Nanotube production, researchers rely on the application of Laser Ablation. Laboratory scientists depend on Extrel MAX and MAX-LT Mass Spectrometer Systems for most of these applications. Coupled with high performance and high speed, these detection systems also provide high sensitivity and high abundance sensitivity to monitor low level components in a high background.
Analysts use Outgassing Studies to determine the chemical and physical properties of materials that are under various temperature and pressure conditions. Outgassing research analyzes materials used in the production of Aerospace and Semiconductor devices. This application is also well-suited to analyze devices such as Medical/Surgical Equipment, Automotive Parts and High Precision Ceramics, where high quality results are critical for successful research studies.
One technique used to characterize the physical and electronic properties of the surface of a material is Helium Scattering and mass spectrometry. A beam of atoms, usually Helium, is aimed at a surface, and atoms from the surface are ejected. Mass Filters are used to measure the atoms that are scattered, and to pinpoint the angle and time at which the scattering atoms are being released (time of flight analysis). Since the events of this non-destructive surface science method happen quickly, this application requires the use of mass filters that provide high stability and fast response times.
Secondary Ion Mass Spectrometry (SIMS) is used to detect and characterize trace elements at or near the surface of a solid or thin film allowing researchers to understand the chemical composition of the surface. This surface science technique requires the use of systems with very high sensitivity and the ability to perform high resolution energy analysis. SIMS is useful for a wide variety of surface analysis. For example, SIMS can be used to detect and analyze contaminants on a surface, analyze materials and devices to ensure the quality of specific products, and study atomic scale defects that may occur in the manufacturing of semiconductor chips or other materials.
Temperature Programmed Desorption (TPD) is one of the most widely used surface analysis techniques available for materials research scientists. To analyze material compositions, surface interactions and surface contaminates, scientists rely on Extrels Mass Spectrometry systems.
Thermogravimetric analysis (TGA) is a powerful approach to the study of the thermal behavior of solid and liquid samples. The interface of TGA with a quadrupole mass spectrometer allows the researcher to characterize and quantify the compounds in the off-gas in real-time along with each mass loss.