Researchers studying the use of Catalysts strive to better understand how they function and respond under different conditions. Tracking the inlet and outlet of the reactor helps the investigator develop an understanding of the catalytic reaction.
Extrel provides a wide range of gas analyzer solutions for catalysis research and development.
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Secondary Ion Mass Spectrometry (SIMS) is used to detect and characterize trace elements at or near the surface of a solid or thin film allowing researchers to understand the chemical composition of the surface. This surface science technique requires the use of systems with very high sensitivity and the ability to perform high resolution energy analysis. SIMS is useful for a wide variety of surface analysis. For example, SIMS can be used to detect and analyze contaminants on a surface, analyze materials and devices to ensure the quality of specific products, and study atomic scale defects that may occur in the manufacturing of semiconductor chips or other materials.
Temperature Programmed Desorption (TPD) is one of the most widely used surface analysis techniques available for materials research scientists. To analyze material compositions, surface interactions and surface contaminates, scientists rely on Extrels Mass Spectrometry systems.
Evolved Gas Analysis (EGA) is the analysis of the effluent of analytical equipment and chemical processes. Understanding the dynamic composition of the gases released by thermogravimetric analysis (TGA) or continuous flow systems can provide insight into the mechanisms at work within the experiment. The MAX300-EGA has the speed and sensitivity to detect even small changes in the off-gas as they occur.